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[IEEE Comput. Soc 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Boston, MA, USA (3-5 Nov. 2003)] Proceedings. 16th IEEE Symposium on Computer Arithmetic - Heterogeneous redundancy for fault and defect tolerance with complexity independent area overhead

โœ Scribed by Kumar, V.V.; Lach, J.


Book ID
118129434
Publisher
IEEE Comput. Soc
Year
2003
Weight
225 KB
Volume
0
Category
Article
ISBN-13
9780769520421

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