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[IEEE Comput. Soc 16th IEEE VLSI Test Symposium - Monterey, CA, USA (26-30 April 1998)] Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231) - Fault detection and diagnosis of interconnects of random access memories

✍ Scribed by Zhao, J.; Meyer, F.J.; Lombardi, F.

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