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[IEEE Comput. Soc 16th IEEE VLSI Test Symposium - Monterey, CA, USA (26-30 April 1998)] Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231) - Fast self-recovering controllers

✍ Scribed by Hertwig, A.; Hellebrand, S.; Wunderlich, H.-J.

Book ID: 118240459
Publisher: IEEE Comput. Soc
Year: 1998
Tongue: English
Weight: 40 KB
Volume: 0
Category: Article
ISBN-13: 9780818684364
DOI: 10.1109/vtest.1998.670883

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