𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE Comput. Soc 16th IEEE VLSI Test Symposium - Monterey, CA, USA (26-30 April 1998)] Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231) - Fault models and tests for two-port memories

✍ Scribed by van de Goor, A.J.; Hamdioui, S.

Book ID: 121182755
Publisher: IEEE Comput. Soc
Year: 1998
Weight: 269 KB
Category: Article
ISBN-13: 9780818684364
DOI: 10.1109/VTEST.1998.670898

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE Comput. Soc 16th IEEE VLSI Test Sy

[IEEE Comput. Soc 16th IEEE VLSI Test Symposium - Monterey, CA, USA (26-30 April 1998)] Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231) - Fast self-recovering controllers

✍ Hertwig, A.; Hellebrand, S.; Wunderlich, H.-J. 📂 Article 📅 1998 🏛 IEEE Comput. Soc 🌐 English ⚖ 40 KB

[IEEE Comput. Soc 16th IEEE VLSI Test Sy

[IEEE Comput. Soc 16th IEEE VLSI Test Symposium - Monterey, CA, USA (26-30 April 1998)] Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231) - Fault detection and diagnosis of interconnects of random access memories

✍ Zhao, J.; Meyer, F.J.; Lombardi, F. 📂 Article 📅 1998 🏛 IEEE Comput. Soc ⚖ 127 KB

[IEEE Comput. Soc 16th IEEE VLSI Test Sy

[IEEE Comput. Soc 16th IEEE VLSI Test Symposium - Monterey, CA, USA (26-30 April 1998)] Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231) - Design of phase shifters for BIST applications

✍ Rajski, J.; Tyszer, J. 📂 Article 📅 1998 🏛 IEEE Comput. Soc 🌐 English ⚖ 205 KB

[IEEE Comput. Soc 16th IEEE VLSI Test Sy

[IEEE Comput. Soc 16th IEEE VLSI Test Symposium - Monterey, CA, USA (26-30 April 1998)] Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231) - Using verification technology for validation coverage analysis and test generation

✍ Moundanos, D.; Abraham, J.A. 📂 Article 📅 1998 🏛 IEEE Comput. Soc ⚖ 198 KB

[IEEE Comput. Soc 16th IEEE VLSI Test Sy

[IEEE Comput. Soc 16th IEEE VLSI Test Symposium - Monterey, CA, USA (26-30 April 1998)] Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231) - Automatic test pattern generation for crosstalk glitches in digital circuits

✍ Kyung Tek Lee, ; Nordquist, C.; Abraham, J.A. 📂 Article 📅 1998 🏛 IEEE Comput. Soc ⚖ 210 KB

[IEEE Comput. Soc 16th IEEE VLSI Test Sy

[IEEE Comput. Soc 16th IEEE VLSI Test Symposium - Monterey, CA, USA (26-30 April 1998)] Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231) - Built-in self testing of sequential circuits using precomputed test sets

✍ Iyengar, V.; Chakrabarty, K.; Murray, B.T. 📂 Article 📅 1998 🏛 IEEE Comput. Soc 🌐 English ⚖ 216 KB