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[IEEE Comput. Soc 16th IEEE VLSI Test Symposium - Monterey, CA, USA (26-30 April 1998)] Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231) - Built-in self testing of sequential circuits using precomputed test sets

✍ Scribed by Iyengar, V.; Chakrabarty, K.; Murray, B.T.

No coin nor oath required. For personal study only.

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