𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2014 International Conference on Microelectronic Test Structures (ICMTS) - Udine, Italy (2014.3.24-2014.3.27)] 2014 International Conference on Microelectronic Test Structures (ICMTS) - Calibration methods for silicon nanowire BioFETs

✍ Scribed by Vacic, Aleksandar; Criscione, Jason M; Stern, Eric; Rajan, Nitin K; Fahmy, Tarek; Reed, Mark A.

Book ID: 126556036
Publisher: IEEE
Year: 2014
Weight: 669 KB
Category: Article
ISBN: 1479921939
DOI: 10.1109/ICMTS.2014.6841493

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2014 International Conference on M

[IEEE 2014 International Conference on Microelectronic Test Structures (ICMTS) - Udine, Italy (2014.3.24-2014.3.27)] 2014 International Conference on Microelectronic Test Structures (ICMTS) - Low specific contact resistivity nickel to silicon carbide determined using a two contact circular test structure

✍ Pan, Yue; Collins, Aaron M.; Leech, Patrick W.; Reeves, Geoffrey K.; Holland, An 📂 Article 📅 2014 🏛 IEEE ⚖ 669 KB

[IEEE 2011 International Conference on M

[IEEE 2011 International Conference on Microelectronic Test Structures (ICMTS) - Amsterdam, Netherlands (2011.04.4-2011.04.7)] 2011 IEEE ICMTS International Conference on Microelectronic Test Structures - Contact resistance measurement structures for high frequencies

✍ Roy, Deepu; Pijper, Ralf M. T.; Tiemeijer, Luuk F.; Wolters, Rob A. M. 📂 Article 📅 2011 🏛 IEEE ⚖ 471 KB

[IEEE 2010 International Conference on M

[IEEE 2010 International Conference on Microelectronic Test Structures (ICMTS) - Hiroshima, Japan (2010.03.22-2010.03.25)] 2010 International Conference on Microelectronic Test Structures (ICMTS) - A universal structure for SRAM cell characterization

✍ Deng, Xiaowei; Houston, Theodore W.; Duong, Anhkim; Loh, Wah Kit 📂 Article 📅 2010 🏛 IEEE ⚖ 536 KB

[IEEE 2011 International Conference on M

[IEEE 2011 International Conference on Microelectronic Test Structures (ICMTS) - Amsterdam, Netherlands (2011.04.4-2011.04.7)] 2011 IEEE ICMTS International Conference on Microelectronic Test Structures - Improved parameter extraction procedures for the R3 model

✍ McAndrew, Colin C.; Bettinger, Tamara 📂 Article 📅 2011 🏛 IEEE ⚖ 333 KB

[IEEE 2011 International Conference on M

[IEEE 2011 International Conference on Microelectronic Test Structures (ICMTS) - Amsterdam, Netherlands (2011.04.4-2011.04.7)] 2011 IEEE ICMTS International Conference on Microelectronic Test Structures - Silicon high frequency test structures improvement for millimeter wave varactors characterization optimization and modeling

✍ Sonnerat, F.; Debroucke, R.; Morandini, Y.; Gloria, D.; Arnould, J-D; Gaquiere, 📂 Article 📅 2011 🏛 IEEE ⚖ 511 KB

[IEEE 2010 International Conference on M

[IEEE 2010 International Conference on Microelectronic Test Structures (ICMTS) - Hiroshima, Japan (2010.03.22-2010.03.25)] 2010 International Conference on Microelectronic Test Structures (ICMTS) - Comprehensive quality assurance methodology for BSIM4.5 corner parameter extraction

✍ Masuda, Hiroo; Itoh, Satoshi; Koike, Hiroshi; Wakita, Naoki; Inagaki, Ryosuke 📂 Article 📅 2010 🏛 IEEE ⚖ 283 KB