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[IEEE 2010 International Conference on Microelectronic Test Structures (ICMTS) - Hiroshima, Japan (2010.03.22-2010.03.25)] 2010 International Conference on Microelectronic Test Structures (ICMTS) - Comprehensive quality assurance methodology for BSIM4.5 corner parameter extraction

✍ Scribed by Masuda, Hiroo; Itoh, Satoshi; Koike, Hiroshi; Wakita, Naoki; Inagaki, Ryosuke

Book ID: 121669883
Publisher: IEEE
Year: 2010
Weight: 283 KB
Category: Article
ISBN: 1424469120
DOI: 10.1109/ICMTS.2010.5466819

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