✦ LIBER ✦

[IEEE 2014 International Conference on Microelectronic Test Structures (ICMTS) - Udine, Italy (2014.3.24-2014.3.27)] 2014 International Conference on Microelectronic Test Structures (ICMTS) - Low specific contact resistivity nickel to silicon carbide determined using a two contact circular test structure

✍ Scribed by Pan, Yue; Collins, Aaron M.; Leech, Patrick W.; Reeves, Geoffrey K.; Holland, Anthony S.; Tanner, Philip

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2014 International Conference on M

✍ Vacic, Aleksandar; Criscione, Jason M; Stern, Eric; Rajan, Nitin K; Fahmy, Tarek 📂 Article 📅 2014 🏛 IEEE ⚖ 669 KB

[IEEE 2008 IEEE International Conference

✍ Stavitskil, N.; Klootwijk, J. H.; van Zeijl, H. W.; Kovalgin, A. Y.; Wolters, R. 📂 Article 📅 2008 🏛 IEEE ⚖ 521 KB

[IEEE 2009 IEEE International Conference

✍ Isogai, T.; Tanaka, H.; Teramoto, A.; Goto, T.; Sugawa, S.; Ohmi, T. 📂 Article 📅 2009 🏛 IEEE ⚖ 158 KB