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[IEEE 2013 IEEE International Interconnect Technology Conference - IITC - Kyoto, Japan (2013.06.13-2013.06.15)] 2013 IEEE International Interconnect Technology Conference - IITC - CPI challenges in advanced Si technology nodes

✍ Scribed by Liu, C. S.; Pu, H. P.; Chen, C. S.; Tsai, H. Y.; Lee, C. H.; Lii, M. J.; Yu, Doug C. H.

Book ID: 126647125
Publisher: IEEE
Year: 2013
Weight: 766 KB
Category: Article
ISBN: 1479904384
DOI: 10.1109/IITC.2013.6615559

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