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[IEEE 2013 IEEE International Interconnect Technology Conference - IITC - Kyoto, Japan (2013.06.13-2013.06.15)] 2013 IEEE International Interconnect Technology Conference - IITC - Origin of large contact resistance in organic field-effect transistors

✍ Scribed by Minari, Takeo; Liu, Chuan

Book ID: 121750909
Publisher: IEEE
Year: 2013
Weight: 917 KB
Category: Article
ISBN: 1479904384
DOI: 10.1109/IITC.2013.6615588

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