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[IEEE 2013 IEEE International Integrated Reliability Workshop (IIRW) - South Lake Tahoe, CA, USA (2013.10.13-2013.10.17)] 2013 IEEE International Integrated Reliability Workshop Final Report - Mechanisms and performance of metal oxide resistive RAM (RRAM)

✍ Scribed by Chen, An; Meneghini, Matteo; Van Blerkom, Daniel; Schanovsky, Franz; Shaw, Tom

Book ID: 127126875
Publisher: IEEE
Year: 2013
Weight: 62 KB
Category: Article
ISBN: 1479903515
DOI: 10.1109/iirw.2013.6804191

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