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[IEEE 2013 IEEE International Integrated Reliability Workshop (IIRW) - South Lake Tahoe, CA, USA (2013.10.13-2013.10.17)] 2013 IEEE International Integrated Reliability Workshop Final Report - Understanding operation and reliability in HFOx RRAM devices through physical modeling

✍ Scribed by Larcher, Luca

Book ID: 124068019
Publisher: IEEE
Year: 2013
Weight: 51 KB
Category: Article
ISBN: 1479903515
DOI: 10.1109/IIRW.2013.6804157

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