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[IEEE 2013 IEEE International Integrated Reliability Workshop (IIRW) - South Lake Tahoe, CA, USA (2013.10.13-2013.10.17)] 2013 IEEE International Integrated Reliability Workshop Final Report - Critical thickness for GaN thin film on AlN substrate

✍ Scribed by Coppeta, R. A.; Ceric, H.; Holec, D.; Grasser, T.

Book ID: 126759283
Publisher: IEEE
Year: 2013
Weight: 222 KB
Category: Article
ISBN: 1479903515
DOI: 10.1109/IIRW.2013.6804177

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