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[IEEE 2013 IEEE 31st VLSI Test Symposium (VTS) - Berkeley, CA (2013.4.29-2013.5.2)] 2013 IEEE 31st VLSI Test Symposium (VTS) - SOC test compression scheme using sequential linear decompressors with retained free variables

✍ Scribed by Muthyala, S. S.; Touba, N. A.

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