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[IEEE 2013 IEEE 31st VLSI Test Symposium (VTS) - Berkeley, CA (2013.4.29-2013.5.2)] 2013 IEEE 31st VLSI Test Symposium (VTS) - Experiences in side channel and testing based Hardware Trojan detection

✍ Scribed by Hely, D.; Martin, J.; Triana, G. D. P.; Mounier, S. P.; Riviere, E.; Sahuc, T.; Savonet, J.; Soundararadjou, L.

Book ID: 121003343
Publisher: IEEE
Year: 2013
Weight: 505 KB
Category: Article
ISBN: 1467355410
DOI: 10.1109/VTS.2013.6548924

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