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[IEEE 2013 IEEE 31st VLSI Test Symposium (VTS) - Berkeley, CA (2013.4.29-2013.5.2)] 2013 IEEE 31st VLSI Test Symposium (VTS) - Selection of tests for outlier detection

✍ Scribed by Bossers, H. C. M.; Hurink, J. L.; Smit, G. J. M.

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