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[IEEE 2013 IEEE 31st VLSI Test Symposium (VTS) - Berkeley, CA (2013.4.29-2013.5.2)] 2013 IEEE 31st VLSI Test Symposium (VTS) - 3D-IC interconnect test, diagnosis, and repair

✍ Scribed by Chun-Chuan Chi, ; Cheng-Wen Wu, ; Min-Jer Wang, ; Hung-Chih Lin,

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