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[IEEE 2013 IEEE 31st VLSI Test Symposium (VTS) - Berkeley, CA (2013.4.29-2013.5.2)] 2013 IEEE 31st VLSI Test Symposium (VTS) - Allocation of RAM built-in self-repair circuits for SOC dies of 3D ICs

✍ Scribed by Chih-Sheng Hou, ; Jin-Fu Li,

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