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[IEEE 2013 IEEE 31st VLSI Test Symposium (VTS) - Berkeley, CA (2013.4.29-2013.5.2)] 2013 IEEE 31st VLSI Test Symposium (VTS) - A multi-parameter functional side-channel analysis method for hardware trust verification

✍ Scribed by Bell, C.; Lewandowski, M.; Katkoori, S.

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