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[IEEE 2013 IEEE 31st VLSI Test Symposium (VTS) - Berkeley, CA (2013.4.29-2013.5.2)] 2013 IEEE 31st VLSI Test Symposium (VTS) - Identification of critical variables using an FPGA-based fault injection framework

✍ Scribed by Riefert, A.; Muller, J.; Sauer, M.; Burgard, W.; Becker, B.

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