𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2013 71st Annual Device Research Conference (DRC) - Notre Dame, IN, USA (2013.06.23-2013.06.26)] 71st Device Research Conference - Quantification of interface trap density above threshold voltage by gated hall method in InGaAs buried quantum well MOSFET

✍ Scribed by Chidambaram, Thenappan; Madisetti, Shailesh; Greene, Andrew; Yakimov, Michael; Tokranov, Vadim; Veksler, Dmitry; Hill, Richard; Oktyabrsky, Serge

Book ID: 121848616
Publisher: IEEE
Year: 2013
Weight: 288 KB
Category: Article
ISBN: 1479908126
DOI: 10.1109/DRC.2013.6633826

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2013 71st Annual Device Research C

[IEEE 2013 71st Annual Device Research Conference (DRC) - Notre Dame, IN, USA (2013.06.23-2013.06.26)] 71st Device Research Conference - Evaluating the scalability of multilayer MoS2 transistors

✍ Das, Saptarshi; Appenzeller, Joerg 📂 Article 📅 2013 🏛 IEEE ⚖ 663 KB

[IEEE 2013 71st Annual Device Research C

[IEEE 2013 71st Annual Device Research Conference (DRC) - Notre Dame, IN, USA (2013.06.23-2013.06.26)] 71st Device Research Conference - Narrow-channel accumulated-body bulk Si MOSFETs with wide-range dynamic threshold voltage tuning

✍ Akbulut, Mustafa B.; Dirisaglik, Faruk; Cywar, Adam; Faraclas, Azer; Pence, Doug 📂 Article 📅 2013 🏛 IEEE ⚖ 977 KB

[IEEE 2013 71st Annual Device Research C

[IEEE 2013 71st Annual Device Research Conference (DRC) - Notre Dame, IN, USA (2013.06.23-2013.06.26)] 71st Device Research Conference - Mobility strain response and low temperature characterization of Ge p-MOSFETs

✍ Wong, I-Hsieh; Chen, Yen-Ting; Ciou, Huang-Jhih; Chen, Yu-Sheng; Yan, Jhih-Yang; 📂 Article 📅 2013 🏛 IEEE ⚖ 929 KB

[IEEE 2013 71st Annual Device Research C

[IEEE 2013 71st Annual Device Research Conference (DRC) - Notre Dame, IN, USA (2013.06.23-2013.06.26)] 71st Device Research Conference - Border trap characterization in metal-oxide-graphene capacitors with HfO2 dielectrics

✍ Ebrish, Mona A.; Deen, David A.; Koester, Steven J. 📂 Article 📅 2013 🏛 IEEE ⚖ 541 KB

[IEEE 2013 71st Annual Device Research C

[IEEE 2013 71st Annual Device Research Conference (DRC) - Notre Dame, IN, USA (2013.06.23-2013.06.26)] 71st Device Research Conference - Extended-gate biosensors achieve fluid stability with no loss in charge sensitivity

✍ Dak, Piyush; Nair, Pradeep; Go, Jonghyun; Alam, Muhammad A. 📂 Article 📅 2013 🏛 IEEE ⚖ 986 KB

[IEEE 2013 71st Annual Device Research C

[IEEE 2013 71st Annual Device Research Conference (DRC) - Notre Dame, IN, USA (2013.06.23-2013.06.26)] 71st Device Research Conference - Computational study of the mobility in ultra-thin topological insulator films

✍ Yin, Gen; Wickramaratne, Darshana; Lake, Roger K. 📂 Article 📅 2013 🏛 IEEE ⚖ 640 KB