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[IEEE 2013 71st Annual Device Research Conference (DRC) - Notre Dame, IN, USA (2013.06.23-2013.06.26)] 71st Device Research Conference - Narrow-channel accumulated-body bulk Si MOSFETs with wide-range dynamic threshold voltage tuning

✍ Scribed by Akbulut, Mustafa B.; Dirisaglik, Faruk; Cywar, Adam; Faraclas, Azer; Pence, Douglas; Patel, Jyotica; Steen, Steven; Nunes, Ron; Silva, Helena; Gokirmak, Ali

Book ID: 121362708
Publisher: IEEE
Year: 2013
Weight: 977 KB
Category: Article
ISBN: 1479908126
DOI: 10.1109/DRC.2013.6633883

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