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[IEEE 2013 71st Annual Device Research Conference (DRC) - Notre Dame, IN, USA (2013.06.23-2013.06.26)] 71st Device Research Conference - Evaluating the scalability of multilayer MoS2 transistors

✍ Scribed by Das, Saptarshi; Appenzeller, Joerg

Book ID: 121678231
Publisher: IEEE
Year: 2013
Weight: 663 KB
Category: Article
ISBN: 1479908126
DOI: 10.1109/drc.2013.6633839

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