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[IEEE 2013 71st Annual Device Research Conference (DRC) - Notre Dame, IN, USA (2013.06.23-2013.06.26)] 71st Device Research Conference - Mobility strain response and low temperature characterization of Ge p-MOSFETs

✍ Scribed by Wong, I-Hsieh; Chen, Yen-Ting; Ciou, Huang-Jhih; Chen, Yu-Sheng; Yan, Jhih-Yang; Liu, Chee Wee

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