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[IEEE 2013 71st Annual Device Research Conference (DRC) - Notre Dame, IN, USA (2013.06.23-2013.06.26)] 71st Device Research Conference - Border trap characterization in metal-oxide-graphene capacitors with HfO2 dielectrics

✍ Scribed by Ebrish, Mona A.; Deen, David A.; Koester, Steven J.

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