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[IEEE 2012 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA, USA (2012.04.15-2012.04.19)] 2012 IEEE International Reliability Physics Symposium (IRPS) - On the electro-mechanical reliability of NEMFET as an analog/digital switch

โœ Scribed by Jain, Ankit; Islam, A. E.; Alam, M. A.


Book ID
125458628
Publisher
IEEE
Year
2012
Weight
521 KB
Category
Article
ISBN
1457716798

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