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[IEEE 2012 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA, USA (2012.04.15-2012.04.19)] 2012 IEEE International Reliability Physics Symposium (IRPS) - Charge collection mechanism in MEMS capacitive switches

✍ Scribed by Koutsoureli, Matroni; Michalas, Loukas; Papaioannou, George

Book ID: 120198661
Publisher: IEEE
Year: 2012
Weight: 171 KB
Category: Article
ISBN: 1457716798
DOI: 10.1109/IRPS.2012.6241916

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