[IEEE 2012 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA, USA (2012.04.15-2012.04.19)] 2012 IEEE International Reliability Physics Symposium (IRPS) - 28nm node bulk vs FDSOI reliability comparison

[IEEE 2012 IEEE International Reliabilit

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[IEEE 2012 IEEE International Reliabilit

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[IEEE 2012 IEEE International Reliabilit

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[IEEE 2012 IEEE International Reliabilit

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[IEEE 2012 IEEE International Reliabilit

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[IEEE 2012 IEEE International Reliabilit

✍ Silverman, Timothy J; Bosco, Nick; Kurtz, Sarah 📂 Article 📅 2012 🏛 IEEE ⚖ 322 KB