[IEEE 2012 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA, USA (2012.04.15-2012.04.19)] 2012 IEEE International Reliability Physics Symposium (IRPS) - Relative lifetime prediction for CPV die-attach layers

[IEEE 2012 IEEE International Reliabilit

✍ Dalal, Vikram L.; Mayer, Robert; Bhattacharya, Joydeep; Samiee, Mehram 📂 Article 📅 2012 🏛 IEEE ⚖ 413 KB

[IEEE 2012 IEEE International Reliabilit

✍ Bonilla, G.; Shaw, T.M.; Liniger, E.G.; Cohen, S.; Gates, S.M.; Grill, A.; Shobh 📂 Article 📅 2012 🏛 IEEE ⚖ 297 KB

[IEEE 2012 IEEE International Reliabilit

✍ Federspiel, X.; Angot, D.; Rafik, M.; Cacho, F.; Bajolet, A.; Planes, N.; Roy, D 📂 Article 📅 2012 🏛 IEEE ⚖ 740 KB

[IEEE 2012 IEEE International Reliabilit

✍ Schlunder, Christian; Aresu, Stefano; Georgakos, Georg; Kanert, Werner; Reisinge 📂 Article 📅 2012 🏛 IEEE ⚖ 474 KB

[IEEE 2012 IEEE International Reliabilit

✍ Koutsoureli, Matroni; Michalas, Loukas; Papaioannou, George 📂 Article 📅 2012 🏛 IEEE ⚖ 171 KB

[IEEE 2012 IEEE International Reliabilit

✍ Autran, J.L.; Serre, S.; Munteanu, D.; Martinie, S.; Semikh, S.; Sauze, S.; Uzna 📂 Article 📅 2012 🏛 IEEE ⚖ 996 KB