[IEEE 2012 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA, USA (2012.04.15-2012.04.19)] 2012 IEEE International Reliability Physics Symposium (IRPS) - Tailoring dielectric materials for robust BEOL reliability

[IEEE 2012 IEEE International Reliabilit

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[IEEE 2012 IEEE International Reliabilit

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[IEEE 2012 IEEE International Reliabilit

✍ Schlunder, Christian; Aresu, Stefano; Georgakos, Georg; Kanert, Werner; Reisinge 📂 Article 📅 2012 🏛 IEEE ⚖ 474 KB

[IEEE 2012 IEEE International Reliabilit

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[IEEE 2012 IEEE International Reliabilit

✍ Silverman, Timothy J; Bosco, Nick; Kurtz, Sarah 📂 Article 📅 2012 🏛 IEEE ⚖ 322 KB

[IEEE 2012 IEEE International Reliabilit

✍ Autran, J.L.; Serre, S.; Munteanu, D.; Martinie, S.; Semikh, S.; Sauze, S.; Uzna 📂 Article 📅 2012 🏛 IEEE ⚖ 996 KB