[IEEE 2012 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA, USA (2012.04.15-2012.04.19)] 2012 IEEE International Reliability Physics Symposium (IRPS) - A non-obtrusive technique to characterize dielectric charging in RF-MEMS capacitive switches

[IEEE 2012 IEEE International Reliabilit

✍ Koutsoureli, Matroni; Michalas, Loukas; Papaioannou, George 📂 Article 📅 2012 🏛 IEEE ⚖ 171 KB

[IEEE 2012 IEEE International Reliabilit

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✍ Schlunder, Christian; Aresu, Stefano; Georgakos, Georg; Kanert, Werner; Reisinge 📂 Article 📅 2012 🏛 IEEE ⚖ 474 KB

[IEEE 2012 IEEE International Reliabilit

✍ Silverman, Timothy J; Bosco, Nick; Kurtz, Sarah 📂 Article 📅 2012 🏛 IEEE ⚖ 322 KB