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[IEEE 2012 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Osaka (2012.05.9-2012.05.11)] 2012 IEEE International Meeting for Future of Electron Devices, Kansai - Low power and more accurate temperature sensor with an integrated dual slope AD converter

✍ Scribed by Nagahisa, T.; Kubota, S.; Watanabe, H.

Book ID: 115461333
Publisher: IEEE
Year: 2012
Weight: 338 KB
Category: Article
ISBN: 1467308374
DOI: 10.1109/imfedk.2012.6218588

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