𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2012 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Suita, Japan (2012.05.9-2012.05.11)] 2012 IEEE International Meeting for Future of Electron Devices, Kansai - Minority carrier lifetime of thermal degradation in organic light emitting diode

✍ Scribed by Park, Hyun-Ae; Choi, Byoung-Seon; Choi, Byoung-Deog

Book ID: 115451586
Publisher: IEEE
Year: 2012
Weight: 262 KB
Category: Article
ISBN: 1467308374
DOI: 10.1109/imfedk.2012.6218618

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2012 IEEE International Meeting fo

[IEEE 2012 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Suita, Japan (2012.05.9-2012.05.11)] 2012 IEEE International Meeting for Future of Electron Devices, Kansai - Essence and technology direction of ADC design

✍ Matsuzawa, Akira 📂 Article 📅 2012 🏛 IEEE ⚖ 751 KB

[IEEE 2012 IEEE International Meeting fo

[IEEE 2012 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Suita, Japan (2012.05.9-2012.05.11)] 2012 IEEE International Meeting for Future of Electron Devices, Kansai - Graphene-based electro-optical modulator: Concept and analysis

✍ Ryzhii, V.; Satou, A.; Otsuji, T.; Yurchenko, S. O.; Ryzhii, M.; Ryabova, N.; Sh 📂 Article 📅 2012 🏛 IEEE ⚖ 132 KB

[IEEE 2012 IEEE International Meeting fo

[IEEE 2012 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Suita, Japan (2012.05.9-2012.05.11)] 2012 IEEE International Meeting for Future of Electron Devices, Kansai - Observation of conductive filament formation in an organic non-volatile memory resistor device

✍ Dao, T. T.; Tran, T. V.; Higashimine, K.; Okada, H.; Mott, D.; Maenosono, S.; Mu 📂 Article 📅 2012 🏛 IEEE ⚖ 431 KB

[IEEE 2012 IEEE International Meeting fo

[IEEE 2012 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Suita, Japan (2012.05.9-2012.05.11)] 2012 IEEE International Meeting for Future of Electron Devices, Kansai - Characterization of graphene based field effect transistors using nano probing microscopy

✍ Mulyana, Yana; Horita, Masahiro; Ishikawa, Yasuaki; Uraoka, Yukiharu; Koh, Shinj 📂 Article 📅 2012 🏛 IEEE ⚖ 238 KB

[IEEE 2012 IEEE International Meeting fo

[IEEE 2012 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Suita, Japan (2012.05.9-2012.05.11)] 2012 IEEE International Meeting for Future of Electron Devices, Kansai - Strain induced modulation of switching behavior in carbon nanotube tunneling field effect transistors

✍ Nakano, Takashi; Ogawa, Matsuto; Souma, Satofumi 📂 Article 📅 2012 🏛 IEEE ⚖ 514 KB

[IEEE 2012 IEEE International Meeting fo

[IEEE 2012 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Suita, Japan (2012.05.9-2012.05.11)] 2012 IEEE International Meeting for Future of Electron Devices, Kansai - Ellipsoidal band structure effects on current-voltage characteristics in silicon nanowire transistors

✍ Yan, Yi; Mori, Nobuya 📂 Article 📅 2012 🏛 IEEE ⚖ 78 KB