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[IEEE 2012 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Suita, Japan (2012.05.9-2012.05.11)] 2012 IEEE International Meeting for Future of Electron Devices, Kansai - Observation of conductive filament formation in an organic non-volatile memory resistor device

✍ Scribed by Dao, T. T.; Tran, T. V.; Higashimine, K.; Okada, H.; Mott, D.; Maenosono, S.; Murata, H.

Book ID: 111924836
Publisher: IEEE
Year: 2012
Weight: 431 KB
Category: Article
ISBN: 1467308374
DOI: 10.1109/imfedk.2012.6218570

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