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[IEEE 2012 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Suita, Japan (2012.05.9-2012.05.11)] 2012 IEEE International Meeting for Future of Electron Devices, Kansai - Characterization of graphene based field effect transistors using nano probing microscopy

✍ Scribed by Mulyana, Yana; Horita, Masahiro; Ishikawa, Yasuaki; Uraoka, Yukiharu; Koh, Shinji

Book ID: 121256435
Publisher: IEEE
Year: 2012
Weight: 238 KB
Category: Article
ISBN: 1467308374
DOI: 10.1109/IMFEDK.2012.6218619

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