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[IEEE 2012 21st Asian Test Symposium (ATS) - Niigata, Japan (2012.11.19-2012.11.22)] 2012 IEEE 21st Asian Test Symposium - Impact of Resistive-Bridge Defects in TAS-MRAM Architectures

✍ Scribed by Azevedo, J.; Virazel, A.; Bosio, A.; Dilillo, L.; Girard, P.; Todri, A.; Prenat, G.; Alvarez-Herault, J.; Mackay, K.

Book ID: 120367188
Publisher: IEEE
Year: 2012
Weight: 856 KB
Category: Article
ISBN: 0769548768
DOI: 10.1109/ATS.2012.37

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