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[IEEE 2012 21st Asian Test Symposium (ATS) - Niigata, Japan (2012.11.19-2012.11.22)] 2012 IEEE 21st Asian Test Symposium - Variation-Aware Fault Grading

✍ Scribed by Czutro, A.; Imhof, M.E.; Jiang, J.; Mumtaz, A.; Sauer, M.; Becker, B.; Polian, I.; Wunderlich, H.-J.

No coin nor oath required. For personal study only.

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