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[IEEE 2012 21st Asian Test Symposium (ATS) - Niigata, Japan (2012.11.19-2012.11.22)] 2012 IEEE 21st Asian Test Symposium - A Probabilistic and Constraint Based Approach for Low Power Test Generation

โœ Scribed by Sabaghian-Bidgoli, Hossein; Namaki-Shoushtari, Majid; Navabi, Zainalabedin


Book ID
120182875
Publisher
IEEE
Year
2012
Weight
436 KB
Category
Article
ISBN
0769548768

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