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[IEEE 2012 21st Asian Test Symposium (ATS) - Niigata, Japan (2012.11.19-2012.11.22)] 2012 IEEE 21st Asian Test Symposium - A Transition Isolation Scan Cell Design for Low Shift and Capture Power

✍ Scribed by Lin, Yi-Tsung; Huang, Jiun-Lang; Wen, Xiaoqing

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