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[IEEE 2012 21st Asian Test Symposium (ATS) - Niigata, Japan (2012.11.19-2012.11.22)] 2012 IEEE 21st Asian Test Symposium - Low Power BIST for Scan-Shift and Capture Power

✍ Scribed by Sato, Yasuo; Wang, Senling; Kato, Takaaki; Miyase, Kohei; Kajihara, Seiji

No coin nor oath required. For personal study only.

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