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[IEEE 2012 21st Asian Test Symposium (ATS) - Niigata, Japan (2012.11.19-2012.11.22)] 2012 IEEE 21st Asian Test Symposium - A Scan-Out Power Reduction Method for Multi-cycle BIST

✍ Scribed by Wang, Senling; Sato, Yasuo; Miyase, Kohei; Kajihara, Seiji

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