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[IEEE 2012 21st Asian Test Symposium (ATS) - Niigata, Japan (2012.11.19-2012.11.22)] 2012 IEEE 21st Asian Test Symposium - Multi-level EDT to Reduce Scan Channels in SoC Designs

✍ Scribed by Li, Guoliang; Qian, Jun; Li, Peter; Zuo, Greg

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