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[IEEE 2011 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2011.04.10-2011.04.14)] 2011 International Reliability Physics Symposium - Impact of ion-induced transients on high-speed dual-complementary Flip-Flop designs

✍ Scribed by Black, Dolores A.; Reed, Robert A.; Robinson, William H.; Black, Jeffrey D.; Limbrick, Daniel B.; Dick, Kevin D.

Book ID: 121737745
Publisher: IEEE
Year: 2011
Weight: 976 KB
Category: Article
ISBN: 1424491134
DOI: 10.1109/IRPS.2011.5784600

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