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[IEEE 2011 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2011.04.10-2011.04.14)] 2011 International Reliability Physics Symposium - Reliability-limiting defects in AlGaN/GaN HEMTs

✍ Scribed by Roy, Tania; Zhang, En Xia; Fleetwood, Daniel M.; Schrimpf, Ronald D.; Puzyrev, Yevgeniy S.; Pantelides, Sokrates T.

Book ID: 118031972
Publisher: IEEE
Year: 2011
Weight: 301 KB
Volume: 0
Category: Article
ISBN: 1424491134
DOI: 10.1109/irps.2011.5784512

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