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[IEEE 2011 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2011.04.10-2011.04.14)] 2011 International Reliability Physics Symposium - Methodologies for sub-1nm EOT TDDB evaluation

✍ Scribed by Kauerauf, Thomas; Degraeve, Robin; Ragnarsson, Lars-Ake; Roussel, Philippe; Sahhaf, Sahar; Groeseneken, Guido; O'Connor, Robert

Book ID: 120557712
Publisher: IEEE
Year: 2011
Weight: 715 KB
Category: Article
ISBN: 1424491134
DOI: 10.1109/IRPS.2011.5784444

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