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[IEEE 2011 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2011.04.10-2011.04.14)] 2011 International Reliability Physics Symposium - Pulsed laser-induced transient currents in bulk and silicon-on-insulator FinFETs

✍ Scribed by El-Mamouni, F.; Zhang, E. X.; Schrimpf, R. D.; Reed, R. A.; Galloway, K. F.; McMorrow, D.; Simoen, E.; Claeys, C.; Cristoloveanu, S.; Xiong, W.

Book ID: 120535439
Publisher: IEEE
Year: 2011
Weight: 948 KB
Category: Article
ISBN: 1424491134
DOI: 10.1109/IRPS.2011.5784597

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