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[IEEE 2011 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2011.04.10-2011.04.14)] 2011 International Reliability Physics Symposium - Application of reliability test standards to SiC Power MOSFETs

✍ Scribed by Green, Ronald; Lelis, Aivars; Habersat, Daniel

No coin nor oath required. For personal study only.

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