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[IEEE 2011 IEEE International Integrated Reliability Workshop (IIRW) - South Lake Tahoe, CA, USA (2011.10.16-2011.10.20)] 2011 IEEE International Integrated Reliability Workshop Final Report - When does a circuit really fail?

✍ Scribed by Ryan, J. T.; Wei, L.; Campbell, J. P.; Southwick, R. G.; Cheung, K. P.; Oates, A. S.; Wong, H.-S. P.; Suehle, J.

Book ID: 126740911
Publisher: IEEE
Year: 2011
Weight: 284 KB
Category: Article
ISBN: 1457703106
DOI: 10.1109/IIRW.2011.6142583

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