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[IEEE 2011 IEEE International Integrated Reliability Workshop (IIRW) - South Lake Tahoe, CA, USA (2011.10.16-2011.10.20)] 2011 IEEE International Integrated Reliability Workshop Final Report - Hot Carrier Injection degradation induced dispersion: Model and circuit-level measurement

✍ Scribed by Cacho, F.; Singh, S. K.; Singh, B.; Parthasarathy, C.; Pion, E.; Argoud, F.; Federspiel, X.; Pitolet, H.; Roy, D.; Huard, V.

Book ID: 120824787
Publisher: IEEE
Year: 2011
Weight: 592 KB
Category: Article
ISBN: 1457703106
DOI: 10.1109/IIRW.2011.6142609

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