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[IEEE 2011 IEEE 4th International Nanoelectronics Conference (INEC) - Tao-Yuan, Taiwan (2011.06.21-2011.06.24)] The 4th IEEE International NanoElectronics Conference - Deterioration of junction performance with temperature effect for 45 nm Si-capping MOSFETs on silicon substrate

✍ Scribed by Wang, Mu-Chun; Hu, You-Ming; Lin, Long-Sian; Chen, Shuang-Yuan; Liao, Wen-Shiang; Yang, Hsin-Chia; Yang, Ren-Hau; Peng, Ssu-Hao

Book ID: 120067623
Publisher: IEEE
Year: 2011
Weight: 293 KB
Category: Article
ISBN: 1457703793
DOI: 10.1109/INEC.2011.5991639

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